)]}'
{
  "commit": "4085bcc682e1276ab4ac2da9866daadf944d7167",
  "tree": "65a3554fa2325860f246ad6460e20b8e49d7a95a",
  "parents": [
    "fc7fe7691c6bbd5f8f51a87e759770975c648410"
  ],
  "author": {
    "name": "Roman Tereshonkov",
    "email": "roman.tereshonkov@nokia.com",
    "time": "Tue Feb 08 12:02:40 2011 +0200"
  },
  "committer": {
    "name": "David Woodhouse",
    "email": "David.Woodhouse@intel.com",
    "time": "Fri Mar 11 14:22:45 2011 +0000"
  },
  "message": "mtd: tests: add multiblock erase test to the mtd_speedtest\n\nNew multiblock erase speed test is added to mtd_speedtest.\nIt consists of 2-, 4-, 8-, 16-, 32- and 64-blocks at once\nmultiblock erase tests.\n\nSigned-off-by: Roman Tereshonkov \u003croman.tereshonkov@nokia.com\u003e\nSigned-off-by: Artem Bityutskiy \u003cArtem.Bityutskiy@nokia.com\u003e\nSigned-off-by: David Woodhouse \u003cDavid.Woodhouse@intel.com\u003e\n",
  "tree_diff": [
    {
      "type": "modify",
      "old_id": "9bd986ef3b53e3851afbc3a95fd17485fbb761b2",
      "old_mode": 33188,
      "old_path": "drivers/mtd/tests/mtd_speedtest.c",
      "new_id": "3ce6fce75e075401bda65f8edc1140e29775c17a",
      "new_mode": 33188,
      "new_path": "drivers/mtd/tests/mtd_speedtest.c"
    }
  ]
}