sfc: Disable VF queues during register self-test
Currently VF queues and drivers may remain active during this test.
This could cause memory corruption or spurious test failures.
Therefore we reset the port/function before running these tests on
Siena.
On Falcon this doesn't work: we have to do some additional
initialisation before some blocks will work again. So refactor the
reset/register-test sequence into an efx_nic_type method so
efx_selftest() doesn't have to consider such quirks.
In the process, fix another minor bug: Siena does not have an
'invisible' reset and the self-test currently fails to push the PHY
configuration after resetting. Passing RESET_TYPE_ALL to
efx_reset_{down,up}() fixes this.
Signed-off-by: Ben Hutchings <bhutchings@solarflare.com>
diff --git a/drivers/net/ethernet/sfc/selftest.c b/drivers/net/ethernet/sfc/selftest.c
index ccc428f..96068d1 100644
--- a/drivers/net/ethernet/sfc/selftest.c
+++ b/drivers/net/ethernet/sfc/selftest.c
@@ -120,19 +120,6 @@
return rc;
}
-static int efx_test_chip(struct efx_nic *efx, struct efx_self_tests *tests)
-{
- int rc = 0;
-
- /* Test register access */
- if (efx->type->test_registers) {
- rc = efx->type->test_registers(efx);
- tests->registers = rc ? -1 : 1;
- }
-
- return rc;
-}
-
/**************************************************************************
*
* Interrupt and event queue testing
@@ -699,8 +686,7 @@
{
enum efx_loopback_mode loopback_mode = efx->loopback_mode;
int phy_mode = efx->phy_mode;
- enum reset_type reset_method = RESET_TYPE_INVISIBLE;
- int rc_test = 0, rc_reset = 0, rc;
+ int rc_test = 0, rc_reset, rc;
efx_selftest_async_cancel(efx);
@@ -737,44 +723,26 @@
*/
netif_device_detach(efx->net_dev);
- mutex_lock(&efx->mac_lock);
- if (efx->loopback_modes) {
- /* We need the 312 clock from the PHY to test the XMAC
- * registers, so move into XGMII loopback if available */
- if (efx->loopback_modes & (1 << LOOPBACK_XGMII))
- efx->loopback_mode = LOOPBACK_XGMII;
- else
- efx->loopback_mode = __ffs(efx->loopback_modes);
+ if (efx->type->test_chip) {
+ rc_reset = efx->type->test_chip(efx, tests);
+ if (rc_reset) {
+ netif_err(efx, hw, efx->net_dev,
+ "Unable to recover from chip test\n");
+ efx_schedule_reset(efx, RESET_TYPE_DISABLE);
+ return rc_reset;
+ }
+
+ if ((tests->registers < 0) && !rc_test)
+ rc_test = -EIO;
}
- __efx_reconfigure_port(efx);
- mutex_unlock(&efx->mac_lock);
-
- /* free up all consumers of SRAM (including all the queues) */
- efx_reset_down(efx, reset_method);
-
- rc = efx_test_chip(efx, tests);
- if (rc && !rc_test)
- rc_test = rc;
-
- /* reset the chip to recover from the register test */
- rc_reset = efx->type->reset(efx, reset_method);
-
/* Ensure that the phy is powered and out of loopback
* for the bist and loopback tests */
+ mutex_lock(&efx->mac_lock);
efx->phy_mode &= ~PHY_MODE_LOW_POWER;
efx->loopback_mode = LOOPBACK_NONE;
-
- rc = efx_reset_up(efx, reset_method, rc_reset == 0);
- if (rc && !rc_reset)
- rc_reset = rc;
-
- if (rc_reset) {
- netif_err(efx, drv, efx->net_dev,
- "Unable to recover from chip test\n");
- efx_schedule_reset(efx, RESET_TYPE_DISABLE);
- return rc_reset;
- }
+ __efx_reconfigure_port(efx);
+ mutex_unlock(&efx->mac_lock);
rc = efx_test_phy(efx, tests, flags);
if (rc && !rc_test)