| Linus Torvalds | 1da177e | 2005-04-16 15:20:36 -0700 | [diff] [blame] | 1 | /* $Id: estate.h,v 1.1 2001/03/28 10:56:34 davem Exp $ */ | 
|  | 2 | #ifndef _SPARC64_ESTATE_H | 
|  | 3 | #define _SPARC64_ESTATE_H | 
|  | 4 |  | 
|  | 5 | /* UltraSPARC-III E-cache Error Enable */ | 
|  | 6 | #define ESTATE_ERROR_FMT	0x0000000000040000 /* Force MTAG ECC		*/ | 
|  | 7 | #define ESTATE_ERROR_FMESS	0x000000000003c000 /* Forced MTAG ECC val	*/ | 
|  | 8 | #define ESTATE_ERROR_FMD	0x0000000000002000 /* Force DATA ECC		*/ | 
|  | 9 | #define ESTATE_ERROR_FDECC	0x0000000000001ff0 /* Forced DATA ECC val	*/ | 
|  | 10 | #define ESTATE_ERROR_UCEEN	0x0000000000000008 /* See below			*/ | 
|  | 11 | #define ESTATE_ERROR_NCEEN	0x0000000000000002 /* See below			*/ | 
|  | 12 | #define ESTATE_ERROR_CEEN	0x0000000000000001 /* See below			*/ | 
|  | 13 |  | 
|  | 14 | /* UCEEN enables the fast_ECC_error trap for: 1) software correctable E-cache | 
|  | 15 | * errors 2) uncorrectable E-cache errors.  Such events only occur on reads | 
|  | 16 | * of the E-cache by the local processor for: 1) data loads 2) instruction | 
|  | 17 | * fetches 3) atomic operations.  Such events _cannot_ occur for: 1) merge | 
|  | 18 | * 2) writeback 2) copyout.  The AFSR bits associated with these traps are | 
|  | 19 | * UCC and UCU. | 
|  | 20 | */ | 
|  | 21 |  | 
|  | 22 | /* NCEEN enables instruction_access_error, data_access_error, and ECC_error traps | 
|  | 23 | * for uncorrectable ECC errors and system errors. | 
|  | 24 | * | 
|  | 25 | * Uncorrectable system bus data error or MTAG ECC error, system bus TimeOUT, | 
|  | 26 | * or system bus BusERR: | 
|  | 27 | * 1) As the result of an instruction fetch, will generate instruction_access_error | 
|  | 28 | * 2) As the result of a load etc. will generate data_access_error. | 
|  | 29 | * 3) As the result of store merge completion, writeback, or copyout will | 
|  | 30 | *    generate a disrupting ECC_error trap. | 
|  | 31 | * 4) As the result of such errors on instruction vector fetch can generate any | 
|  | 32 | *    of the 3 trap types. | 
|  | 33 | * | 
|  | 34 | * The AFSR bits associated with these traps are EMU, EDU, WDU, CPU, IVU, UE, | 
|  | 35 | * BERR, and TO. | 
|  | 36 | */ | 
|  | 37 |  | 
|  | 38 | /* CEEN enables the ECC_error trap for hardware corrected ECC errors.  System bus | 
|  | 39 | * reads resulting in a hardware corrected data or MTAG ECC error will generate an | 
|  | 40 | * ECC_error disrupting trap with this bit enabled. | 
|  | 41 | * | 
|  | 42 | * This same trap will also be generated when a hardware corrected ECC error results | 
|  | 43 | * during store merge, writeback, and copyout operations. | 
|  | 44 | */ | 
|  | 45 |  | 
|  | 46 | /* In general, if the trap enable bits above are disabled the AFSR bits will still | 
|  | 47 | * log the events even though the trap will not be generated by the processor. | 
|  | 48 | */ | 
|  | 49 |  | 
|  | 50 | #endif /* _SPARC64_ESTATE_H */ |