| Kyungmin Park | 87590e2 | 2005-09-27 11:26:39 +0100 | [diff] [blame] | 1 | /* | 
|  | 2 | *  linux/include/linux/mtd/bbm.h | 
|  | 3 | * | 
|  | 4 | *  NAND family Bad Block Management (BBM) header file | 
|  | 5 | *    - Bad Block Table (BBT) implementation | 
|  | 6 | * | 
|  | 7 | *  Copyright (c) 2005 Samsung Electronics | 
|  | 8 | *  Kyungmin Park <kyungmin.park@samsung.com> | 
|  | 9 | * | 
|  | 10 | *  Copyright (c) 2000-2005 | 
|  | 11 | *  Thomas Gleixner <tglx@linuxtronix.de> | 
|  | 12 | * | 
|  | 13 | */ | 
|  | 14 | #ifndef __LINUX_MTD_BBM_H | 
|  | 15 | #define __LINUX_MTD_BBM_H | 
|  | 16 |  | 
|  | 17 | /* The maximum number of NAND chips in an array */ | 
|  | 18 | #define NAND_MAX_CHIPS		8 | 
|  | 19 |  | 
|  | 20 | /** | 
|  | 21 | * struct nand_bbt_descr - bad block table descriptor | 
|  | 22 | * @param options	options for this descriptor | 
|  | 23 | * @param pages		the page(s) where we find the bbt, used with | 
|  | 24 | * 			option BBT_ABSPAGE when bbt is searched, | 
|  | 25 | * 			then we store the found bbts pages here. | 
|  | 26 | *			Its an array and supports up to 8 chips now | 
|  | 27 | * @param offs		offset of the pattern in the oob area of the page | 
|  | 28 | * @param veroffs	offset of the bbt version counter in the oob are of the page | 
|  | 29 | * @param version	version read from the bbt page during scan | 
|  | 30 | * @param len		length of the pattern, if 0 no pattern check is performed | 
|  | 31 | * @param maxblocks	maximum number of blocks to search for a bbt. This number of | 
| Thomas Gleixner | 61ecfa8 | 2005-11-07 11:15:31 +0000 | [diff] [blame] | 32 | *			blocks is reserved at the end of the device | 
| Kyungmin Park | 87590e2 | 2005-09-27 11:26:39 +0100 | [diff] [blame] | 33 | *			where the tables are written. | 
|  | 34 | * @param reserved_block_code	if non-0, this pattern denotes a reserved | 
|  | 35 | *			(rather than bad) block in the stored bbt | 
|  | 36 | * @param pattern	pattern to identify bad block table or factory marked | 
|  | 37 | *			good / bad blocks, can be NULL, if len = 0 | 
|  | 38 | * | 
|  | 39 | * Descriptor for the bad block table marker and the descriptor for the | 
|  | 40 | * pattern which identifies good and bad blocks. The assumption is made | 
|  | 41 | * that the pattern and the version count are always located in the oob area | 
|  | 42 | * of the first block. | 
|  | 43 | */ | 
|  | 44 | struct nand_bbt_descr { | 
|  | 45 | int options; | 
|  | 46 | int pages[NAND_MAX_CHIPS]; | 
|  | 47 | int offs; | 
|  | 48 | int veroffs; | 
|  | 49 | uint8_t version[NAND_MAX_CHIPS]; | 
|  | 50 | int len; | 
|  | 51 | int maxblocks; | 
|  | 52 | int reserved_block_code; | 
|  | 53 | uint8_t *pattern; | 
|  | 54 | }; | 
|  | 55 |  | 
|  | 56 | /* Options for the bad block table descriptors */ | 
|  | 57 |  | 
|  | 58 | /* The number of bits used per block in the bbt on the device */ | 
|  | 59 | #define NAND_BBT_NRBITS_MSK	0x0000000F | 
|  | 60 | #define NAND_BBT_1BIT		0x00000001 | 
|  | 61 | #define NAND_BBT_2BIT		0x00000002 | 
|  | 62 | #define NAND_BBT_4BIT		0x00000004 | 
|  | 63 | #define NAND_BBT_8BIT		0x00000008 | 
|  | 64 | /* The bad block table is in the last good block of the device */ | 
|  | 65 | #define NAND_BBT_LASTBLOCK	0x00000010 | 
|  | 66 | /* The bbt is at the given page, else we must scan for the bbt */ | 
|  | 67 | #define NAND_BBT_ABSPAGE	0x00000020 | 
|  | 68 | /* The bbt is at the given page, else we must scan for the bbt */ | 
|  | 69 | #define NAND_BBT_SEARCH		0x00000040 | 
|  | 70 | /* bbt is stored per chip on multichip devices */ | 
|  | 71 | #define NAND_BBT_PERCHIP	0x00000080 | 
|  | 72 | /* bbt has a version counter at offset veroffs */ | 
|  | 73 | #define NAND_BBT_VERSION	0x00000100 | 
|  | 74 | /* Create a bbt if none axists */ | 
|  | 75 | #define NAND_BBT_CREATE		0x00000200 | 
|  | 76 | /* Search good / bad pattern through all pages of a block */ | 
|  | 77 | #define NAND_BBT_SCANALLPAGES	0x00000400 | 
|  | 78 | /* Scan block empty during good / bad block scan */ | 
|  | 79 | #define NAND_BBT_SCANEMPTY	0x00000800 | 
|  | 80 | /* Write bbt if neccecary */ | 
|  | 81 | #define NAND_BBT_WRITE		0x00001000 | 
|  | 82 | /* Read and write back block contents when writing bbt */ | 
|  | 83 | #define NAND_BBT_SAVECONTENT	0x00002000 | 
|  | 84 | /* Search good / bad pattern on the first and the second page */ | 
|  | 85 | #define NAND_BBT_SCAN2NDPAGE	0x00004000 | 
|  | 86 |  | 
|  | 87 | /* The maximum number of blocks to scan for a bbt */ | 
|  | 88 | #define NAND_BBT_SCAN_MAXBLOCKS	4 | 
|  | 89 |  | 
|  | 90 | /* | 
|  | 91 | * Constants for oob configuration | 
|  | 92 | */ | 
|  | 93 | #define ONENAND_BADBLOCK_POS	0 | 
|  | 94 |  | 
|  | 95 | /** | 
|  | 96 | * struct bbt_info - [GENERIC] Bad Block Table data structure | 
|  | 97 | * @param bbt_erase_shift	[INTERN] number of address bits in a bbt entry | 
|  | 98 | * @param badblockpos		[INTERN] position of the bad block marker in the oob area | 
|  | 99 | * @param bbt			[INTERN] bad block table pointer | 
|  | 100 | * @param badblock_pattern	[REPLACEABLE] bad block scan pattern used for initial bad block scan | 
|  | 101 | * @param priv			[OPTIONAL] pointer to private bbm date | 
|  | 102 | */ | 
|  | 103 | struct bbm_info { | 
|  | 104 | int bbt_erase_shift; | 
|  | 105 | int badblockpos; | 
|  | 106 | int options; | 
|  | 107 |  | 
|  | 108 | uint8_t *bbt; | 
|  | 109 |  | 
|  | 110 | int (*isbad_bbt)(struct mtd_info *mtd, loff_t ofs, int allowbbt); | 
|  | 111 |  | 
|  | 112 | /* TODO Add more NAND specific fileds */ | 
|  | 113 | struct nand_bbt_descr *badblock_pattern; | 
|  | 114 |  | 
|  | 115 | void *priv; | 
|  | 116 | }; | 
|  | 117 |  | 
|  | 118 | /* OneNAND BBT interface */ | 
|  | 119 | extern int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd); | 
|  | 120 | extern int onenand_default_bbt(struct mtd_info *mtd); | 
|  | 121 |  | 
|  | 122 | #endif	/* __LINUX_MTD_BBM_H */ |